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SIDAM Public Documents

These publications are subject to copyright and may not be copied, sold, or distributed. Please contact the respective authors for more information.

List of documents Publications

 TitleDescriptionSize (Mb)Upload DatePrivate
SelectPublication ListList 25 June 20090.0225 Jun 09
SelectAdv. X-ray Analysis paperproceedings of Denver conf 200910.9002 Dec 09
SelectJAppl Cryst sources from indents 0.5129 Nov 10
SelectJ Appl Cryst edge sources 0.4430 May 11
SelectCrack propagation predictionAppl Phys Lett 20122.5703 Sep 12
Select450mm wafer inspection capabilitysubmitted to Adv X-ray Analysis5.4103 Sep 12
SelectSlip anisotropyJ Appl Phys 20123.2903 Sep 12